VISCOM 3D AXI/AOI Ultra-fast Handling Meets Outstanding Image Quality– iX7056 II
Ultra-Fast Handling with Outstanding Image Quality The VISCOM iX7056 II combines state-of-the-art X-ray technology with exceptional inspection precision for high-end electronics. This inline X-ray system has earned five international awards for its extremely high throughput and superior image quality.
Overview
A key feature of the iX7056 II is the option to integrate AOI inspection within the system, enabling combined AXI and AOI inspections in a single compact platform. This space-saving capability ensures fast, comprehensive inspection results for single and double-sided electronic assemblies, enhancing production efficiency without compromising quality.
Features
- Award-Winning Technology: Recognized with 5 international awards for throughput and image quality.
- Combined Inspection: Simultaneous AXI and AOI inspections within one system.
- Versatile Application: Supports inspection of single and double-sided assemblies.
- Scalable Throughput: Available with three different flat panel detector sizes to meet production needs.
- Space-Efficient Design: Maximizes inspection capabilities while minimizing footprint.
- Ultra-Thorough Inspection: Delivers precise analysis for complex electronic components.
Specifications
- Inspection Type: 3D AXI with optional integrated AOI
- Application: Single & double-sided electronic assemblies
- Awards: 5 international awards for performance
- Detector Options: Three flat panel detector sizes for scalable throughput
- Features: High throughput, outstanding image quality, space-saving combined inspection