VISCOM Lab – to – Fab – iX7059 One
Versatile X-ray Inspection System The VISCOM iX7059 One stands out for its versatility and comprehensive X-ray inspection capabilities across 2D, 2.5D, and 3D imaging. Designed to meet the diverse demands of modern manufacturing, it supports applications ranging from single semiconductor devices with intricate internal structures to leadframe applications that require in-depth analysis.
Overview
Whether operating as a standalone unit or integrated for 100% inline inspection, the iX7059 One offers unparalleled performance in production environments. It delivers unrivaled image quality with up to 1μm resolution, ensuring that even the most complex and minute details are captured with precision.
Features
- Multi-Dimensional X-ray Inspection: Supports 2D, 2.5D, and 3D X-ray imaging.
- Versatile Application: Inspects both semiconductor devices and leadframe applications.
- High Resolution: Exceptional image clarity down to 1μm resolution.
- Inline & Standalone Operation: Capable of 100% inline inspection or standalone use.
- Comprehensive Analysis: Provides detailed visualization for complex internal structures.
Specifications
- Imaging Capability: 2D, 2.5D, 3D X-ray inspection
- Resolution: Up to 1μm
- Application Range: Semiconductor devices, leadframes
- Operation Mode: Standalone or 100% Inline inspection
- Performance: High precision and image quality for comprehensive analysis